4 results
Strain Measurements Using Nano-Beam Diffraction on a FE-STEM
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 836-837
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- August 2007
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Development of Automatic Magnification Calibration Function for Scanning Transmission Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 752-753
- Print publication:
- August 2005
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Composition and Strain Analysis of Semiconductor Heterostructures Using Thickness Fringes on Tem Images
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- Journal:
- MRS Online Proceedings Library Archive / Volume 332 / 1994
- Published online by Cambridge University Press:
- 21 February 2011, 213
- Print publication:
- 1994
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Observations of X-Ray Jets Using Yohkoh Soft X-Ray Telescope
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- Journal:
- International Astronomical Union Colloquium / Volume 141 / 1993
- Published online by Cambridge University Press:
- 12 April 2016, pp. 343-346
- Print publication:
- 1993
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